The Proceedings Of The Symposium On Design, Test, Integration, And Packaging Of Mems/moems, Dtip is reputed journal publishes research related to Control and Optimization; Electrical and Electronic Engineering; Electronic, Optical and Magnetic Materials; Instrumentation; Safety, Risk, Reliability and Quality. The ISSN of the journal is .
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| Journal Title | Proceedings of the Symposium on Design, Test, Integration, and Packaging of MEMS/MOEMS, DTIP |
|---|---|
| Publisher | Institute of Electrical and Electronics Engineers Inc. |
| Publication Country | United States |
| ISSN | 28368487, 27681874 |
| Publication Area | Engineering; Materials Science; Mathematics; Physics and Astronomy |
| Publication Language | ENG |
| Review Process | |
| Scopus Indexed | Yes |
The Proceedings Of The Symposium On Design, Test, Integration, And Packaging Of Mems/moems, Dtip is ranked in -.
The journal is not indexed in any major database.