Electronic Device Failure Analysis: Impact Factor, Indexing, Publication Time & Fees
The Electronic Device Failure Analysis is reputed journal publishes research related to Engineering. The ISSN of the journal is 15370755.
Through this web page, researchers can check the indexing, publication fee, journal quartile, and journal aim & scope.
Electronic Device Failure Analysis: Details
| Journal Title | Electronic Device Failure Analysis |
|---|
| Publisher | ASM International |
|---|
| Publication Country | United States |
|---|
| ISSN | 15370755 |
|---|
| Publication Area | Electrical and Electronic Engineering (Q4); Safety, Risk, Reliability and Quality (Q4) |
|---|
| Publication Language | |
|---|
| Review Process | |
|---|
| Scopus Indexed | Yes |
|---|
Journal Quartile
The Electronic Device Failure Analysis is ranked in Q4.
Indexing
The Electronic Device Failure Analysis is indexed in: Scopus, UGC CARE Group 2.
Similiar journals to publish
ISSN: 15370755
Publisher: ASM International
Journal Scope: Engineering
ISSN: 1873-1961
Publisher: PERGAMON-ELSEVIER SCIENCE LTD
Journal Scope: Engineering; Materials Science
ISSN: 1864-1245
Publisher: SPRINGERNATURE
Journal Scope: Engineering; Materials Science
ISSN: 2476-0994
Publisher: Verduci Editore
Journal Scope: basic and clinical research, medical devices, adjuvant treatments, dietary supplements, translation medicine, public health
ISSN: 1558-0563
Publisher: IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Journal Scope: Engineering; Materials Science
ISSN: 1558-2574
Publisher: IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Journal Scope: Engineering; Materials Science