Electronic Device Failure Analysis: Impact Factor, Indexing, Publication Time & Fees


The Electronic Device Failure Analysis is reputed journal publishes research related to Engineering. The ISSN of the journal is 15370755.

Through this web page, researchers can check the indexing, publication fee, journal quartile, and journal aim & scope.

Electronic Device Failure Analysis: Details

Journal TitleElectronic Device Failure Analysis
PublisherASM International
Publication CountryUnited States
ISSN15370755
Publication AreaElectrical and Electronic Engineering (Q4); Safety, Risk, Reliability and Quality (Q4)
Publication Language
Review Process
Scopus IndexedYes

Journal Quartile

The Electronic Device Failure Analysis is ranked in Q4.

Indexing

The Electronic Device Failure Analysis is indexed in: Scopus, UGC CARE Group 2.



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